System and method for IDDQ measurement in system on a chip...

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor

Reexamination Certificate

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C324S765010, C324S762010

Reexamination Certificate

active

11010135

ABSTRACT:
System and method for detecting transistor failure in large-scale integrated circuits by measuring IDDQ. A preferred embodiment comprises a switch structure for an integrated circuit made up of a plurality of main switches (such as main switch410) selectively coupling a power sub-domain to a power source pin, a plurality of pi-switches (such as pi-switch415) selectively coupling pairs of power sub-domains, and a plurality of IDDQ switches (such as IDDQ switch425) selectively coupling the power sub-domains to a VIDDQ pin. The pi-switches can decouple the power sub-domains while the IDDQ switches can enable the measurement of the quiescent current in the power sub-domains. The use of pi-switches and IDDQ switches can permit the measurement of the quiescent current in the power sub-domains without requiring the use of isolation buffers and needed to powering on and off the integrated circuit between current measurements in the different power sub-domains.

REFERENCES:
patent: 2004/0027160 (2004-02-01), Joshi et al.
patent: 2005/0127756 (2005-06-01), Shepard et al.

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