Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Reexamination Certificate
2007-10-16
2007-10-16
Tang, Minh N. (Department: 2829)
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
With rotor
C324S765010, C324S762010
Reexamination Certificate
active
11010135
ABSTRACT:
System and method for detecting transistor failure in large-scale integrated circuits by measuring IDDQ. A preferred embodiment comprises a switch structure for an integrated circuit made up of a plurality of main switches (such as main switch410) selectively coupling a power sub-domain to a power source pin, a plurality of pi-switches (such as pi-switch415) selectively coupling pairs of power sub-domains, and a plurality of IDDQ switches (such as IDDQ switch425) selectively coupling the power sub-domains to a VIDDQ pin. The pi-switches can decouple the power sub-domains while the IDDQ switches can enable the measurement of the quiescent current in the power sub-domains. The use of pi-switches and IDDQ switches can permit the measurement of the quiescent current in the power sub-domains without requiring the use of isolation buffers and needed to powering on and off the integrated circuit between current measurements in the different power sub-domains.
REFERENCES:
patent: 2004/0027160 (2004-02-01), Joshi et al.
patent: 2005/0127756 (2005-06-01), Shepard et al.
Chen Wei
Ko Uming
Mair Hugh T.
Scott David B.
Brady W. James
Tang Minh N.
Telecky , Jr. Frederick J.
Texas Instruments Incorporated
Wu Dolly
LandOfFree
System and method for IDDQ measurement in system on a chip... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with System and method for IDDQ measurement in system on a chip..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System and method for IDDQ measurement in system on a chip... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3860057