System and method for generating and measuring noise parameters

Details System and method for generating and measuring noise parameters System and method for generating and measuring noise parameters

2007-02-13

2007-02-13

Hoff, Marc S. (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

C702S017000, C702S057000, C702S066000, C702S067000, C702S069000, C702S070000, C702S111000, C324S613000

Reexamination Certificate

active

10853467

ABSTRACT:
A method for measuring noise parameters includes generating a noise signal at a noise source. The noise signal includes a first input signal at a first frequency and a second input signal at a second frequency. The first input signal and the second input signal are modulated onto a carrier to generate a modulated signal. The modulated signal is attenuated to a desired power level and applied to a device under test to obtain a noise measurement.

REFERENCES:
patent: 4742561 (1988-05-01), Tipton
patent: 4972511 (1990-11-01), Singer et al.
patent: 5371481 (1994-12-01), Tiittanen et al.
patent: 5719579 (1998-02-01), Torre et al.
patent: 6657510 (2003-12-01), Haghighat

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