System and method for generating a SHMOO plot by varying the...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

Reexamination Certificate

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C702S081000, C702S118000

Reexamination Certificate

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06870388

ABSTRACT:
A scheme for testing an electrical device to determine a range of combinations of values of N parametric variables, i.e., a SHMOO plot, for which the device functions properly. In one embodiment, the method comprises defining an N-dimensional plot region comprising a plurality of operating points each corresponding to a particular combination of values of the N parametric variables. The plot region is successively subdivided into smaller sub-regions, based on determining whether the electrical device passes or fails upon testing at each operating point of a predetermined subset of operating points of the plot region or one of the smaller sub-regions, until a minimum resolution is achieved.

REFERENCES:
patent: 6023777 (2000-02-01), Knaack
patent: 6079038 (2000-06-01), Huston et al.
patent: 6418387 (2002-07-01), Carney
patent: 6820021 (2004-11-01), Weller

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