Data processing: measuring – calibrating – or testing – Testing system
Reexamination Certificate
2005-01-25
2005-01-25
Wachsman, Hal (Department: 2857)
Data processing: measuring, calibrating, or testing
Testing system
C702S117000, C324S500000
Reexamination Certificate
active
06847909
ABSTRACT:
One embodiment comprises testing an electrical device using a combination of values of first and second parameters corresponding to a selected operating point comprising an origin of an R, θ polar coordinate plane; if the electrical device is determined to function in a passing manner at the selected operating point, updating the value of the polar coordinate R by incrementing the value thereof by a predetermined amount ΔR; otherwise, updating the value of the polar coordinate R by decrementing the value thereof by ΔR; if the updated value of the polar coordinate R is determined to be beyond an edge of a defined plot region, updating the value of the polar coordinate θ by a predetermined amount Δθ; and identifying an operating point corresponding to at least one of the updated values of the polar coordinates R and θ.
REFERENCES:
patent: 6023777 (2000-02-01), Knaack
patent: 6079038 (2000-06-01), Huston et al.
patent: 6418387 (2002-07-01), Carney
patent: 6625769 (2003-09-01), Huott et al.
patent: 20030093737 (2003-05-01), Purtell et al.
patent: 20030120451 (2003-06-01), Thatcher et al.
Hewlett--Packard Development Company, L.P.
Wachsman Hal
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