Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2005-06-21
2005-06-21
Mehta, Bhavesh M. (Department: 2625)
Image analysis
Applications
Manufacturing or product inspection
C382S203000, C382S285000, C345S421000, C345S442000
Reexamination Certificate
active
06909801
ABSTRACT:
A system and method for generating a curve, such as a Low Discrepancy Curve, on a surface, such as an abstract surface with a Riemannian metric. The system may comprise a computer which includes a CPU and a memory medium which is operable to store one or more programs executable by the CPU to perform the method. The method may: 1) parameterize the surface; 2) select a curve, such as a Low Discrepancy Curve, in a parameter space, for example, a simple space such as a unit square; 3) re-parameterize the surface, for example, re-parameterize the surface such that a ratio of line and area elements of the surface based on a Riemannian metric is constant; and 4) map the curve onto the surface using the re-parameterization. The method may also generate output comprising information regarding the mapped curve, for example, displaying the mapped curve on a display device.
REFERENCES:
patent: 4740079 (1988-04-01), Koizumi et al.
patent: 5268998 (1993-12-01), Simpson
patent: 5378915 (1995-01-01), Hines et al.
patent: 5559901 (1996-09-01), Lobregt
patent: 5722405 (1998-03-01), Goldberg
patent: 5754180 (1998-05-01), Kivolowitz et al.
patent: 5790442 (1998-08-01), Ninomiya et al.
patent: 5797396 (1998-08-01), Geiser et al.
patent: 5805783 (1998-09-01), Ellson et al.
patent: 5815596 (1998-09-01), Ahuja et al.
patent: 5903458 (1999-05-01), Stewart et al.
patent: 6023680 (2000-02-01), Wooster et al.
patent: 6031932 (2000-02-01), Bronstein et al.
patent: 6100893 (2000-08-01), Ensz et al.
patent: 6124858 (2000-09-01), Ge et al.
patent: 6175644 (2001-01-01), Scola et al.
patent: 6175652 (2001-01-01), Jacobson et al.
patent: 6192293 (2001-02-01), Yamada et al.
patent: 6229921 (2001-05-01), Wenzel et al.
patent: 6271856 (2001-08-01), Krishnamurthy
patent: 6370270 (2002-04-01), Nair et al.
patent: 6510244 (2003-01-01), Proesmans et al.
patent: 6514082 (2003-02-01), Kaufman et al.
patent: 6529193 (2003-03-01), Herken et al.
patent: 6563906 (2003-05-01), Hussein et al.
patent: 6639597 (2003-10-01), Zwicker et al.
patent: 6639685 (2003-10-01), Gu et al.
patent: 6643533 (2003-11-01), Knoplioch et al.
patent: 6690474 (2004-02-01), Shirley
patent: 6697497 (2004-02-01), Jensen et al.
patent: 6724930 (2004-04-01), Kosaka et al.
patent: 2002/0141645 (2002-10-01), Rajagopal et al.
“Numerical Recipes in Fortran 77: The Art of Scientific Computing” (ISBN 0-521-436064-X) pp. 299-306, Copyright 1986-1992.
Davies, T.J.G. and R.R. Martin, “Low-discrepancy sequences for volume properties in solid modeling,” CSG'98, 1998.
Nair Dinesh
Rajagopal Ram
Wenzel Lothar
Chawan Sheela
Hood Jeffrey C.
Mehta Bhavesh M.
Meyertons Hood Kivlin Kowert & Goetzel P.C.
National Instruments Corporation
LandOfFree
System and method for generating a low discrepancy curve on... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with System and method for generating a low discrepancy curve on..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System and method for generating a low discrepancy curve on... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3477586