Pulse or digital communications – Testing – Phase error or phase jitter
Reexamination Certificate
2008-01-01
2008-01-01
Fan, Chieh (Department: 2611)
Pulse or digital communications
Testing
Phase error or phase jitter
C375S225000, C375S227000, C375S228000, C375S280000
Reexamination Certificate
active
11114572
ABSTRACT:
A multi-speed jittered signal generator (216, 400) that generates a full-speed jittered signal (404) by scaling a low-speed jittered signal (420) using a frequency scaler (428). The low-speed jittered signal is created by injecting a modulation signal (416) into a reference signal (412) using a jitter injector (432). Injecting jitter into a low-speed reference signal allows the full-speed jittered signal to be of higher quality than conventional jitter signals created by injecting jitter information into a full-speed reference signal. The multi-speed jittered signal generator may be used as part of a testing system (208) for testing various circuitry, such as high-speed serializer/deserializer circuitry (220).
REFERENCES:
patent: 5835501 (1998-11-01), Dalmia et al.
patent: 5903605 (1999-05-01), Crittenden
patent: 6185510 (2001-02-01), Inoue
patent: 6275057 (2001-08-01), Takizawa
patent: 6522122 (2003-02-01), Watanabe et al.
patent: 6594595 (2003-07-01), Yamaguchi et al.
patent: 6665808 (2003-12-01), Schinzel
patent: 7103791 (2006-09-01), Lin
patent: 2004/0156429 (2004-08-01), Joseph et al.
patent: 2004/0252802 (2004-12-01), Yamaguchi
patent: 2005/0069031 (2005-03-01), Sunter et al.
patent: 2005/0111536 (2005-05-01), Cranford et al.
patent: 2005/0163204 (2005-07-01), Brewer
patent: 2005/0253617 (2005-11-01), Roberts et al.
patent: WO03/073680 (2003-09-01), None
Duerden Geoffrey D.
Hafed Mohamed M.
Roberts Gordon W.
DFT Microsystems Inc.
Downs Rachlin & Martin PLLC
Fan Chieh
Ghulamali Qutub
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