System and method for forming single-crystal domains using...

Single-crystal – oriented-crystal – and epitaxy growth processes; – Forming from vapor or gaseous state – With decomposition of a precursor

Reexamination Certificate

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C117S103000, C438S488000

Reexamination Certificate

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06913649

ABSTRACT:
Single-crystal devices and a method for forming semiconductor film single-crystal domains are provided. The method comprises: forming a substrate, such as glass or Si; forming an insulator film overlying the substrate; forming a single-crystal seed overlying the substrate and insulator; forming an amorphous film overlying the seed; annealing the amorphous film; and, forming a single-crystal domain in the film responsive to the single-crystal seed. The annealing technique can be (conventional) laser annealing, a laser induced lateral growth (LiLAC) process, or conventional furnace annealing. In some aspects forming a single-crystal seed includes forming a nanowire or a self assembled monolayer (SAM). For example, a Si nanowire can be formed having a crystallographic orientation of <110> or <100>. When, the seed has a <100> crystallographic orientation, then an n-type TFT can be formed. Likewise, when a single-crystal seed has a <110> crystallographic orientation, a p-type TFT can be formed.

REFERENCES:
patent: 5827773 (1998-10-01), Voutsas
patent: 1995-125908 (1995-04-01), None
patent: 62035674 (1998-08-01), None
D.D.D. Ma et al., Small-Diameter Silicon Nanowire Surfaces, Science, vol. 299, pp. 1874 (2003).
W. Lu et al., Symmetry breaking in self-assembled monolayers on solid surfaces: Anisotropic surface stress, Physical Review B, vol. 65, 085401.

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