Data processing: measuring – calibrating – or testing – Measurement system – Accelerometer
Reexamination Certificate
2007-03-13
2007-03-13
Barlow, John (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Accelerometer
Reexamination Certificate
active
11001957
ABSTRACT:
A system and method is provided for electronic device fall detection. The system and method provides the ability to reliably detect falls even in the presence of other motion in the electronic device. The fall detection system includes a plurality of accelerometers and a processor. The plurality of accelerometers provides acceleration measurements to the processor, with these measurements describing the current acceleration of the electronic device in all directions. The processor receives the acceleration measurements and compares the acceleration measurements to a value range to determine if the device is currently falling. Furthermore, the system and method can reliably detect a non-linear fall, such as when the fall is accompanied with device rotation or initiated by additional external force. To detect a non-linear fall, the processor compares combinations of acceleration measurements to a value range and further determines the smoothness of the acceleration measurement combinations.
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Borras Rodrigo L.
Clifford Michelle A.
Gomez Leticia
Ueda Akihiro
Barlow John
Freescale Semiconductor Inc.
Ingrassia Fisher & Lorenz
Khuu Cindy D.
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