System and method for evaluating the planarity and...

Details System and method for evaluating the planarity and... System and method for evaluating the planarity and...

2005-03-22

2005-03-22

Cuneo, Kamand (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S1540PB, C324S757020, C324S759030, C033S533000

Reexamination Certificate

active

06870382

ABSTRACT:
A system includes a support member and a computer system. The support member holds and retains a probe card, which has an array of probe tips extending therefrom. The computer system includes a software program. The software causes the computer system to perform a method including the following. A position where electrical contact occurs between at least some of the probe tips of the probe tip array and a selected surface is determined through testing. Data for the positions where electrical contact occurs is recorded. The recorded data is sorted for a shortest distance where electrical contact occurred between each probe tip tested and the selected surface during the testing. The sorted data group is plotted on a three dimensional cartesian coordinate system. The system may be used for evaluating the planarity of the probe tip array and parallelism of the probe tip array relative to the selected surface.

REFERENCES:
patent: 4660294 (1987-04-01), Schmidt
patent: 4751457 (1988-06-01), Veenendaal

Affiliated with

Also associated with

Rating

System and method for evaluating the planarity and... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with System and method for evaluating the planarity and..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System and method for evaluating the planarity and... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3453167