System and method for enhancing erase performance in a CMOS...

Static information storage and retrieval – Floating gate – Particular biasing

Reexamination Certificate

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C365S185220

Reexamination Certificate

active

07471572

ABSTRACT:
A system and method are disclosed for enhancing the performance of erase operations in CMOS compatible EEPROM memory cells. An EEPROM memory cell is described in which the erase voltage and the coupling ratio of the EEPROM memory cell are simultaneously decreased while maintaining the erase performance (e.g., erase speed) of the EEPROM memory cell. Significant improvement in the endurance of CMOS compatible EEPROM devices is obtained due to the enhanced erase performance of the EEPROM memory cells of the present invention.

REFERENCES:
patent: 6020231 (2000-02-01), Wang et al.
patent: 6191980 (2001-02-01), Kelley et al.
patent: 6897727 (2005-05-01), Mallinson
Kee-Yeol Na et al., “High-Performance Single Polysilicon EEPROM With Stacked MIM Capacitor,” IEEE Electron Device Letters, vol. 27, No. 4, Apr. 2006, pp. 294-296.

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