Optics: measuring and testing – Inspection of flaws or impurities – Textile inspection
Patent
1996-02-21
2000-10-10
Evans, F. L.
Optics: measuring and testing
Inspection of flaws or impurities
Textile inspection
25055924, 356430, 83361, 83371, 28227, G01N 2189
Patent
active
061307467
ABSTRACT:
A system or method for electronically simulating fabrics to assist in grading yarn and fabric qualities, in which the diameter or other qualities of one or more yarn samples along the total length of the samples is measured, and representations of the measured yarn qualities are evaluated in a fabric pattern to assist evaluation of the effects of the yarn quality variations on fabric which potentially would be produced from the sampled yarn.
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Bonneau David
Gordon, Jr. Kendall W.
Nevel Avishai
Dingman Brian M.
Evans F. L.
Lawson-Hemphill Inc.
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