System and method for electronically evaluating predicted fabric

Optics: measuring and testing – Inspection of flaws or impurities – Textile inspection

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25055924, 356430, 83361, 83371, 28227, G01N 2189

Patent

active

061307467

ABSTRACT:
A system or method for electronically simulating fabrics to assist in grading yarn and fabric qualities, in which the diameter or other qualities of one or more yarn samples along the total length of the samples is measured, and representations of the measured yarn qualities are evaluated in a fabric pattern to assist evaluation of the effects of the yarn quality variations on fabric which potentially would be produced from the sampled yarn.

REFERENCES:
patent: 4078253 (1978-03-01), Kajiura et al.
patent: 4152767 (1979-05-01), Laliotis
patent: 4169399 (1979-10-01), Glockner et al.
patent: 4184769 (1980-01-01), Aeppli
patent: 4189841 (1980-02-01), Loepfe
patent: 4430720 (1984-02-01), Aemmer
patent: 4465937 (1984-08-01), Forbes
patent: 4481820 (1984-11-01), Thomann
patent: 4491831 (1985-01-01), Sakai et al.
patent: 4537202 (1985-08-01), Mancini et al.
patent: 4585947 (1986-04-01), Liptay-wagner et al.
patent: 4648054 (1987-03-01), Farah et al.
patent: 4656465 (1987-04-01), Erni et al.
patent: 4719060 (1988-01-01), Ragone
patent: 4753532 (1988-06-01), Alfred
patent: 4758968 (1988-07-01), Lord
patent: 4764876 (1993-06-01), Whitener, Jr. et al.
patent: 4812043 (1989-03-01), Vanstaen
patent: 4885709 (1989-12-01), Edgar et al.
patent: 4887155 (1989-12-01), Massen
patent: 4954976 (1990-09-01), Noonan
patent: 4963757 (1990-10-01), Liefde et al.
patent: 4984181 (1991-01-01), Kliman et al.
patent: 5016183 (1991-05-01), Shyong
patent: 5088827 (1992-02-01), Kyriakis
patent: 5146550 (1992-09-01), Furter et al.
patent: 5181374 (1993-01-01), Aeppli
patent: 5537811 (1996-07-01), Pidous et al.
patent: 5671061 (1997-09-01), Hoeller
Jeong and Suh, Prediction of Yarn and Fabric Qualities Based on Uster Signal Processing, Nov. 1993.
Jeong and Suh, Visualization of Fabric Qualities Through Signal Processing of Yarn Profiles, Nov. 1994.
Sung and Jeong, Statistical Modeling of Spun Yarn Characteristics Under HVI Data Environment, Oct. 1994.
Keisokki Report, Oct. 1983.
Stein, Rechnergesteuerte Zugprufgerate, Textil Praxis International 1984, Jan.
Keisokki Report, Sep. 1985.
Marwinski, et al., Non-destructive testing of twist for large packages of cabled technical yarns, Chemizfasern/Textilindustrie, vol. 43/95, Jun. 1993.

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