Data processing: measuring – calibrating – or testing – Measurement system – History logging or time stamping
Reexamination Certificate
2005-03-01
2005-03-01
Pert, Evan (Department: 2829)
Data processing: measuring, calibrating, or testing
Measurement system
History logging or time stamping
C702S188000
Reexamination Certificate
active
06862557
ABSTRACT:
The present invention is a system for electronically collecting data in a process line in a semiconductor or data storage fabrication facility. The system includes a data collection processing unit configured to sniff data packets transmitted over a LAN between a plurality of tools in the fabrication facility. The data collection processing unit is further configured to determine if the sniffed data packets are valid data packets based on a configuration file established for the plurality of tools. The data collection processing unit is further configured to parse one or more data fragments from the valid data packets.
REFERENCES:
patent: 6721618 (2004-04-01), Baek et al.
“Snoop Server,” searchSecurity.com Definitions, web page printed on Mar. 14, 2003, p.1, located at http://searchsecurity.techtarget.com/sDefinition/0,,sid14_gci773799,00.html.
“SECS/GEM Introduction,” web page printed on Mar. 13, 2003, pp. 1-4, located at http://www.cimetrix.com/gemintromain.html.
Jones Ronald A.
Longacre Jeffrey
LandOfFree
System and method for electronically collecting data in a... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with System and method for electronically collecting data in a..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System and method for electronically collecting data in a... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3434829