System and method for electronic diagnostics of a process...

Data processing: generic control systems or specific application – Specific application – apparatus or process – Product assembly or manufacturing

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C700S121000, C702S051000, C073S040000, C073S040700

Reexamination Certificate

active

11206675

ABSTRACT:
In one embodiment according to the invention, there is disclosed a method of identifying a source of a vacuum quality problem in a vacuum environment associated with a tool. The method comprises gathering and storing vacuum environment data; identifying an anomaly within the vacuum environment; determining a tool component operating state when the anomaly likely occurred; and determining the source of the vacuum quality problem based on a state of the vacuum environment when the anomaly likely occurred and the tool component operating state when the anomaly likely occurred.

REFERENCES:
patent: 4821769 (1989-04-01), Mills et al.
patent: 4823602 (1989-04-01), Christensen, Jr.
patent: 4918930 (1990-04-01), Gaudet et al.
patent: 5008841 (1991-04-01), McElroy
patent: 5140263 (1992-08-01), Leon
patent: 5154080 (1992-10-01), Hill et al.
patent: 5257545 (1993-11-01), Au-Yang
patent: 5327783 (1994-07-01), Au-Yang
patent: 5329956 (1994-07-01), Marriott et al.
patent: 5443368 (1995-08-01), Weeks et al.
patent: 5471400 (1995-11-01), Smalley et al.
patent: 5477149 (1995-12-01), Spencer et al.
patent: 5777901 (1998-07-01), Berezin et al.
patent: 6022195 (2000-02-01), Gaudet et al.
patent: 6073089 (2000-06-01), Baker et al.
patent: 6240329 (2001-05-01), Sun
patent: 6272400 (2001-08-01), Jankins et al.
patent: 6304791 (2001-10-01), Kim
patent: 6349589 (2002-02-01), Zhou
patent: 6532392 (2003-03-01), Eryurek et al.
patent: 6618692 (2003-09-01), Takahashi et al.
patent: 6619123 (2003-09-01), Gianchandani et al.
patent: 6671583 (2003-12-01), Varone et al.
patent: 6902378 (2005-06-01), Gaudet et al.
patent: 6907383 (2005-06-01), Eryurek et al.
patent: 6955072 (2005-10-01), Zarkar et al.
patent: 2002/0035447 (2002-03-01), Takahashi et al.
patent: 2003/0010092 (2003-01-01), Lu et al.
patent: 2005/0010311 (2005-01-01), Barbazette et al.
patent: 2005/0072239 (2005-04-01), Longsdorf et al.
patent: 2005/0091843 (2005-05-01), Yu
patent: 2005/0132808 (2005-06-01), Brown et al.
patent: 2005/0171736 (2005-08-01), Kang
patent: 59-017079 (1984-01-01), None
patent: 03-079805 (1991-04-01), None
patent: 04-254734 (1992-09-01), None
patent: 2000 205992 (2000-07-01), None
Hung, M., et al., “Development of an e-Diagnostics/Maintenance framework for semiconductor factories with security considerations”,Advanced Engineering Information 17(2003) 165-178.
Hung, M., et al, “An e-Diagnostics Framework with Security Considerations for Semiconductor Factories”,IEEE, 2004, pp. 37-40.
Hung, M., et al., “Development of a Web-Services-Based e-Diagnostics Framework for Semiconductor Manufacturing Industry”,IEEE Transactions on Semiconductor Manufacturing, vol. 18, No. 1, Feb. 2005, pp. 122-135.
Huang, H., et al., “Development of Remote Control System of a Semiconductor Cluster Tool”,2002 IEEE International Conference on Systems, Man and Cybernetics, Yasmine Hammamet-Tunisia, Oct. 6-9, 2002.
Conarro, P., et al., “Using Measurement Tools to Assess the Health of Fab Automation Systems”,MICRO: Lead News, downloaded off the Internet Nov. 8, 2005, pp. 1-9.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

System and method for electronic diagnostics of a process... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with System and method for electronic diagnostics of a process..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System and method for electronic diagnostics of a process... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3837692

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.