Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Patent
1997-04-22
1998-12-01
Barlow, Jr., John E.
Data processing: measuring, calibrating, or testing
Testing system
Of circuit
364578, 371 221, 371 48, 395500, 39518301, G01R 3128
Patent
active
058452346
ABSTRACT:
A system and method for generating testing program code for testing an electronic device on an automatic test equipment (ATE) platform are described. The ATE platform is interconnectable to a testing workstation comprising a processor, memory and input/output facilities. The electronic device under test is removably coupled to the ATE platform. The ATE platform further includes a tester for testing the electronic device responsive to the testing program code. The testing of the electronic device on the ATE platform is controlled by and results from the testing of the electronic device are displayed using the input/output facilities of the testing workstation. A library of ATE platform parameters associated with the testing workstation is maintained and the ATE platform parameters for a plurality of ATE platforms including the ATE platform interconnectable to the testing workstation are stored in the library. The testing program code specific to the ATE platform interconnectable to the testing workstation is generated using the ATE platform parameters in the library.
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Martinson Eric C.
Testa Louis C.
Assouad Patrick
Barlow Jr. John E.
Integrated Measurement Systems, Inc.
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