System and method for early qualification of semiconductor...

Details System and method for early qualification of semiconductor... System and method for early qualification of semiconductor...

2008-09-09

2008-09-09

Karlsen, Ernest F. (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S073100, C702S042000, C702S081000, C700S110000

Reexamination Certificate

active

11187486

ABSTRACT:
According to one embodiment of the invention, a method for early qualification of semiconductor device includes performing initial testing on a semiconductor device, receiving fail data on the semiconductor device, determining a solution model for the semiconductor device based on the fail data, storing the solution model, performing subsequent testing on the semiconductor device, and comparing a result of the subsequent testing to the solution model.

REFERENCES:
patent: 4751656 (1988-06-01), Conti et al.
patent: 6258609 (2001-07-01), Farnworth et al.
patent: 6473665 (2002-10-01), Mugibayashi et al.
patent: 6499118 (2002-12-01), Michaelson
patent: 6697691 (2004-02-01), Miller et al.
patent: 6885961 (2005-04-01), Breger et al.

Affiliated with

Also associated with

Rating

System and method for early qualification of semiconductor... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with System and method for early qualification of semiconductor..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System and method for early qualification of semiconductor... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3957353