System and method for dual path length optical analysis of...

Optics: measuring and testing – Inspection of flaws or impurities – Bore inspection

Reexamination Certificate

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C356S241500, C356S432000

Reexamination Certificate

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07826050

ABSTRACT:
A method is disclosed for changing an optical path length through a fluid downhole, comprising interspersing an optically transmissive member into a first optical path through the fluid, thereby creating a second shorter optical path through the fluid. In another embodiment, the method further comprises measuring an intensity of light, I1transmitted through the first optical path; measuring an intensity of light, I2transmitted through the second optical path; and estimating an optical property for the second optical path from the ratio, I1/I2. A system is disclosed for changing an optical path length through a fluid downhole, comprising a fluid passage between two optically transmissive windows for the fluid downhole, the fluid passage having a first optical path through the fluid; and an optically transmissive member for insertion into the first optical path, thereby creating a second shorter optical path through the fluid.

REFERENCES:
patent: 2912895 (1959-11-01), Houston
patent: 4427634 (1984-01-01), Truglio
patent: 4762798 (1988-08-01), Deutsch
patent: 4786171 (1988-11-01), LeFebre et al.
patent: 5044755 (1991-09-01), Landa et al.
patent: 5303036 (1994-04-01), McLachlan et al.
patent: 5311283 (1994-05-01), Heeschen
patent: 2005-007835 (2005-01-01), None
patent: 2006194775 (2006-07-01), None

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