System and method for downhole optical analysis

Details System and method for downhole optical analysis System and method for downhole optical analysis

2007-09-25

2009-10-13

Porta, David P (Department: 2884)

Radiant energy

Geological testing or irradiation

Well testing apparatus and methods

Reexamination Certificate

active

07601950

ABSTRACT:
A method for measuring optical properties of a fluid downhole, the method comprising measuring intensity of light interacting with the fluid downhole for each of one or more wavelengths; integrating each intensity of light for each wavelength for an integration time; and estimating the optical property from a difference between a starting value and an ending value for the integral of the intensity of light over time divided by the integration time for the wavelength. An apparatus is disclosed for measuring an optical property of a fluid downhole, the apparatus comprising one or more photodiodes that measure an intensity of light interacting with the fluid downhole for each of one or more wavelengths; and one or more integration circuits that each integrates an intensity of light for one wavelength for an integration time.

REFERENCES:
patent: 4791446 (1988-12-01), Ishida et al.
patent: 4994671 (1991-02-01), Safinya
patent: 5305233 (1994-04-01), Kawagoe et al.
patent: 5912463 (1999-06-01), Mizuno et al.
patent: 6087656 (2000-07-01), Kimmich
patent: 6150649 (2000-11-01), Wake et al.
patent: 6175383 (2001-01-01), Yadid-Pecht
patent: 6649416 (2003-11-01), Kauer et al.
patent: 6823298 (2004-11-01), Jones et al.
patent: 7196786 (2007-03-01), DiFoggio
patent: 2001/0053556 (2001-12-01), Anderson et al.
patent: 2003/0056581 (2003-03-01), Turner et al.
patent: 0 562 976 (1993-09-01), None
patent: WO 2007/067743 (2007-06-01), None

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