System and method for display test

Details System and method for display test System and method for display test

2009-03-26

2010-10-26

Patel, Paresh (Department: 2829)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

Reexamination Certificate

active

07821287

ABSTRACT:
The system for display test includes a driving circuit having integrated circuit (IC) pads on the substrate and the IC pads are electrically connected to the signal lines, respectively. And the first switches are between the first test pads and the IC pads, wherein the number of the first test pads is less than the number of the IC pads.

REFERENCES:
patent: 5034735 (1991-07-01), Inoue et al.
patent: 5576730 (1996-11-01), Shimada et al.
patent: 5825196 (1998-10-01), Irie et al.
patent: 6028442 (2000-02-01), Lee et al.
patent: 6265889 (2001-07-01), Tomita et al.
patent: 6310594 (2001-10-01), Libsch et al.
patent: 6337722 (2002-01-01), Ha
patent: 6750926 (2004-06-01), Ohgiichi et al.
patent: 6798232 (2004-09-01), Lim
patent: 6831624 (2004-12-01), Harrold
patent: 6873174 (2005-03-01), Matsunaga et al.
patent: 6879179 (2005-04-01), Fujita
patent: 6924874 (2005-08-01), Lin et al.
patent: 6924875 (2005-08-01), Tomita
patent: 6940300 (2005-09-01), Jenkins et al.
patent: 6982568 (2006-01-01), Nojiri et al.
patent: 7145352 (2006-12-01), LaMeres et al.
patent: 7298164 (2007-11-01), Chen et al.
patent: 7342410 (2008-03-01), Hsieh et al.
patent: 2002/0047838 (2002-04-01), Aoki et al.
patent: 2005/0046439 (2005-03-01), Yu
patent: 2005/0057273 (2005-03-01), Lin et al.
patent: 2005/0212782 (2005-09-01), Brunner

Affiliated with

Also associated with

Rating

System and method for display test does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with System and method for display test, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System and method for display test will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4239505