Image analysis – Pattern recognition – Feature extraction
Reexamination Certificate
2004-04-16
2008-09-16
Azarian, Seyed (Department: 2624)
Image analysis
Pattern recognition
Feature extraction
C382S111000, C356S429000
Reexamination Certificate
active
07426302
ABSTRACT:
The present invention provides a novel system and method for digitizing garment patterns. In a system embodiment, there are imaging devices supported above a garment pattern-making table. The imaging devices are connected to a computing device via a suitable network connection. The imaging devices are operable to capture data representative of a known garment pattern, and deliver that data to the computing device. In turn, the computing device is operable to vectorize the pattern. Once vectorized, the pattern is subjected to a fully automated recognition operation, and a file is outputted that includes a digitized pattern representing the garment pattern, including elements such as the border, turn points along the border and other specific elements within the border.
REFERENCES:
patent: 3877903 (1975-04-01), Peterson
patent: 4554635 (1985-11-01), Levine
patent: 4575628 (1986-03-01), Bankart et al.
patent: 4583181 (1986-04-01), Gerber et al.
patent: 4780960 (1988-11-01), Merz
patent: 4853866 (1989-08-01), Andrada Galan et al.
patent: 5089971 (1992-02-01), Gerber
patent: 5315666 (1994-05-01), Norton-Wayne
patent: 5379350 (1995-01-01), Shimazu et al.
patent: 5537946 (1996-07-01), Sadeh et al.
patent: 5757661 (1998-05-01), Surville
patent: 5790687 (1998-08-01), McLaughlin et al.
patent: 5815398 (1998-09-01), Dighe et al.
patent: 5831857 (1998-11-01), Clarino et al.
patent: 5838569 (1998-11-01), Gane
patent: 5953232 (1999-09-01), Blaimschein
patent: 6298275 (2001-10-01), Herman, Jr.
patent: 6587745 (2003-07-01), Polden et al.
patent: 7031527 (2006-04-01), Ishikawa et al.
patent: 2004/0247180 (2004-12-01), Ishikawa
patent: 0363178 (1989-10-01), None
ASTM Subcommittee D13-66, Standard Practice for Sewn Products Pattern DataInterchange—Data Format, Aug. 5, 2003.
Chenyang Xu and J. L. Prince, Active Contours and Gradient Vector Flow, [online] [Retreived on May 28, 2004] Retreived from Image Analysis and Communication Homepage, Johns Hopkins University at http://iacl.ece.jhu.edu/projects/gvf/.
International Search Report issued against International Serial No. PCT/IB2004/03214, dated Oct. 28, 2005.
Written Opinion issued against International Serial No. PCT/IB2004/03214, dated Oct. 28, 2005.
International Preliminary Report on Patentability issued against International Serial No. PCT/IB2004/03214, dated May 29, 2006.
L. Norton-Wayne et al., Measurement of Garment Dimensions using Machine Vision, 3rd International Conference on Image Processing and its Application, Jul. 1989, pp. 197-201.
J. Jimenez and J. Navalon, Some Experiments in Image Vectorization, IBM J. Res. Develop., vol. 26, No. 6, Nov 1982, pp. 724-734.
Amico John
Sberna Carmelo
LandOfFree
System and method for digitizing a pattern does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with System and method for digitizing a pattern, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System and method for digitizing a pattern will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3973549