System and method for determining propagation...

Details System and method for determining propagation... System and method for determining propagation...

2006-04-04

2006-04-04

Nguyen, Tu T. (Department: 2877)

Optics: measuring and testing

For optical fiber or waveguide inspection

Reexamination Certificate

active

07023533

ABSTRACT:
Systems for, and method of, determining propagation characteristics of a photonic structure having a transverse N-fold symmetry. In one embodiment, a system includes: (1) a numerical analyzer that employs a leading order of a systematic homogenization expansion having multiple scales to develop an angularly averaged indexed profile for the photonic structure and (2) a leading order corrector, associated with the numerical analyzer, that further employs the homogenization expansion to refine an imaginary part of an effective index of refraction of the photonic structure.

REFERENCES:
patent: 6788865 (2004-09-01), Kawanishi et al.
patent: 6859598 (2005-02-01), Hasegawa et al.
patent: WO 00/22466 (2000-04-01), None
patent: WO 00/65386 (2000-11-01), None

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