Image analysis – Pattern recognition – Feature extraction
Reexamination Certificate
2011-03-15
2011-03-15
Mehta, Bhavesh M (Department: 2624)
Image analysis
Pattern recognition
Feature extraction
C382S154000, C382S254000, C382S275000, C382S266000
Reexamination Certificate
active
07907781
ABSTRACT:
A method and an apparatus determines a geometry of a scene by projecting one or more output image into the scene, in which a time to project the output image is t1. Input images are acquired of the scene, in which a time to acquire each input image is t2, and in which t1>t2and in which the input image includes a distinguishable stripe of pixels with an edge due to t1>t2. An amount of distortion of the edge is measured from a straight line to determine a geometry of the scene.
REFERENCES:
patent: 2007/0109506 (2007-05-01), Niesten
patent: 2008/0279446 (2008-11-01), Hassebrook et al.
Ivanov Yuri A.
Thornton Jay E.
Wren Christopher R.
Brinkan Dirk
Mehta Bhavesh M
Mitsubishi Electric Research Laboraties, Inc.
Rahmjoo Mike
Vinokur Gene
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