Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate
2006-10-31
2006-10-31
Toatley, Gregory (Department: 2877)
Optics: measuring and testing
By light interference
For dimensional measurement
C356S477000, C356S512000
Reexamination Certificate
active
07130058
ABSTRACT:
Disclosed are a system and a method for determining coordinates of a three-dimensional measurer probe using a beam phase interference method. Two optical fibers are mounted inside the probe, and detecting means obtains an interference pattern generated by beam emitted from a point beam source mounted at ends of the optical fibers. After that, wave front of the interference pattern is measured and a location of the point beam source is determined through a nonlinear optimization from the wave front, and thereby the coordinates of the three-dimensional measurer probe are set. Because the two optical fibers of the inside of the probe to be measured are located in close vicinity to the three-dimensional object, the present measuring system and method can reduce a measurement error, make a structure of the system simple, and thereby reduce a manufacturing cost.
REFERENCES:
patent: 5995223 (1999-11-01), Power
patent: 6208416 (2001-03-01), Huntley et al.
patent: 6297884 (2001-10-01), Drabarek
Kim Seung-Woo
Rhee Hyuggyo
Detschel Marissa J.
Korea Advanced Institute of Science and Technology
Toatley Gregory
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