Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Distributive type parameters
Reexamination Certificate
2005-03-29
2005-03-29
Nguyen, Vincent Q. (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Distributive type parameters
C324S071100, C324S605000, C324S1540PB
Reexamination Certificate
active
06873162
ABSTRACT:
A system and method for determining the dielectric properties associated with a substrate. In one embodiment, a network analyzer measures scattering parameters for at least two lines of substantially identical cross-section embedded within the substrate over a specified frequency range. A first engine determines a complex propagation constant based on the scattering parameters and defines the complex propagation constant in terms of an attenuation component and a phase component. A second engine, responsive to the phase component, determines a relative permittivity parameter associated with the substrate over the specified frequency range. A third engine, responsive to the attenuation component and the relative permittivity parameter, performs a least squares analysis to determine a loss tangent parameter associated with the substrate over the specified frequency range.
REFERENCES:
patent: 5477137 (1995-12-01), Staudinger et al.
patent: 5566257 (1996-10-01), Jaeger et al.
patent: 6106567 (2000-08-01), Grobman et al.
patent: 6320401 (2001-11-01), Sugimoto et al.
patent: 6562448 (2003-05-01), Chamberlain et al.
patent: 20020180004 (2002-12-01), Oggioni et al.
Karl J. Bois, Brian Kirk, Michael Tsuk and David Quint; “Simple and Accurate Determination of Complex Permittivity and Skin Effect of FR4 Material in Gigahertz Regime”; Proceedings of the 53rd Electronic Components and Technology Conference; pp. 1277-1282; New Orleans, LA; May 27-30, 2003.
Ari H. Sihvola and Jin Au Kong; “Effective Permittivity of Dielectric Mixtures”; IEEE Transactions of Geoscience and Remote Sensing, vol. 26, No. 4, Jul. 1988; pp. 420-429.
Micheal D. Janezic and Jeffrey A. Jargon; “Complex Permittivity Determination from Propagation Constant Measurements”; IEEE Microwave and Guided Wave Letters, vol. 9, No. 2, Feb. 1999; pp. 76-78.
Mike Graboise; “Understanding losses is key to state-of-the-art interfacing”; EETimes; Feb. 19, 2003; http://www.eetimes.com/printableArticle?doc_id=OEG20030219S0044; 9 pages.
Bois Karl Joseph
Kirk Brian
Quint David W.
Tsuk Michael
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