System and method for detecting single event latchup in...

Details System and method for detecting single event latchup in... System and method for detecting single event latchup in...

2006-03-31

2010-11-09

Velez, Roberto (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S754120

Reexamination Certificate

active

07830165

ABSTRACT:
A method for testing an integrated circuit for potential latchup sites includes applying a voltage to the integrated circuit, measuring a current through the integrated circuit, applying at least one radiation beam to at least one area of the integrated circuit, and detecting an occurrence of a latchup by detecting an increase of the current through the integrated circuit upon applying the at least one radiation beam to the at least one area of the integrated circuit.

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