System and method for detecting repeating defects in a...

Radiant energy – Photocells; circuits and apparatus – With circuit for evaluating a web – strand – strip – or sheet

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C250S208100

Reexamination Certificate

active

07435986

ABSTRACT:
A system and a method for detecting defects in a light-management film are provided. The system includes a first light source configured to emit light onto a first side of the film in a first predetermined region of the film. The system further includes a second light source configured to emit light onto a second side of the film in the first predetermined region of the film. The system further includes a first camera configured to receive a first portion of light reflected from the first predetermined region of film from the first light source and a second portion of the light propagating through the film from the second light source. Finally, the system includes a signal-processing device openably coupled to the first camera configured to detect a defect in the first predetermined region of the film based on at least one of the first and second portions of light.

REFERENCES:
patent: 5598006 (1997-01-01), Stringa
patent: 5691811 (1997-11-01), Kihira
patent: 6040584 (2000-03-01), Liu et al.
patent: 6774986 (2004-08-01), Laskowski
patent: 6960777 (2005-11-01), Soar
patent: 7030400 (2006-04-01), Rivera et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

System and method for detecting repeating defects in a... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with System and method for detecting repeating defects in a..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System and method for detecting repeating defects in a... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3995800

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.