Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2005-09-13
2005-09-13
Hoff, Marc S. (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S057000, C702S060000, C702S065000, C702S117000, C702S189000, C716S030000, C716S030000, C703S014000, C703S015000, C703S016000, C324S1540PB, C324S715000, C700S067000
Reexamination Certificate
active
06944552
ABSTRACT:
One embodiment of the invention is a method for analyzing power in a component comprising determining a plurality of current densities, wherein each current density is associated with one portion of a plurality of portions of the component, determining a plurality of wire densities, wherein each wire density is associated with one region of a plurality of regions of the component, and comparing the plurality of current densities and the plurality of wire densities.
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Francom Erin
Rogers Gregory D.
Desta Elias
Hoff Marc S.
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