Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – Frequency of cyclic current or voltage
Reexamination Certificate
2001-06-28
2003-09-30
Nghiem, Michael (Department: 2863)
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
Frequency of cyclic current or voltage
Reexamination Certificate
active
06628112
ABSTRACT:
FIELD OF THE INVENTION
This invention relates to synchronous data detection, and more specifically, relates to a phase detection circuit that operates in multiple capacities of synchronous data detection.
BACKGROUND OF THE INVENTION
In systems for synchronous transmission of digital data, an information signal is sent from a transmitting unit to a receiving unit. This transmission may take place over serial or parallel data channels. In either case the data is sent in synchronism with a clock signal. In order to save bandwidth, the clock signal is normally not transmitted with the data. Hence, the receiving unit receives the signal at the same clock rate at which it is transmitted.
Two typical methods for transmitting digital data are baseband and carrier-based transmission. In baseband transmission, a signal is sent directly over a communications link. In carrier-based transmission, the signal is first modulated onto a carrier signal. The modulated carrier signal is then sent to the receiving unit. Common modulation techniques include amplitude modulation (AM), frequency modulation (FM) and phase modulation (PM). When a modulated signal reaches the receiving unit, it is demodulated from the carrier signal to its original form by demodulation circuitry.
The receiving unit then extracts the clock from the baseband or demodulated carrier-based signal in order to generate a reference by which the data can be interpreted. The method for extracting the clock depends on the type of data format used in the binary signal. Some examples of data formats are non-return to zero (NRZ), return to zero (RZ), biphase and delay-modulation.
Each format has associated advantages and disadvantages. The RZ format, for instance, contains a spectral line at the clock frequency, which makes clock recovery easy. The NRZ format, conversely, does not necessarily contain a spectral line at the clock frequency and requires additional circuitry for extraction. The NRZ format is advantageous in another way, however, in that it uses half the bandwidth as does the RZ format, which increases the amount of data that can be sent. Hence, data formats are chosen primarily by the needs and allowances of the particular application.
When using a format such as the NRZ format, the clock must be recovered from the signal. This operation is typically performed by a phase-locked loop (PLL). As depicted in 
FIG. 1
, a PLL 
100
 typically comprises phase offset detection circuitry 
102
, loop filter circuitry 
104
 and a voltage controlled oscillator (VCO). PLL 
100
 modulates VCO 
106
 until it is in phase with the incoming data. The signal generated by VCO 
106
 is then used as the reference clock to interpret the data signal.
In order to do this, phase detector circuit 
102
 detects the phase difference between the incoming data signal and the output of VCO 
106
 and generates phase detection signals 
108
. Phase detection signals 
108
 have a difference in average value that corresponds to the difference in phase between the incoming data signal and the VCO 
106
 output. Loop filter 
104
 converts the difference in average value into an analog voltage signal and filters the signal to remove extraneous noise. An example analog voltage signal 
200
 is shown in FIG. 
2
A. Signal 
200
 is fed to VCO 
106
, which slows down or speeds up in response, bringing the output of VCO 
106
 into phase with the incoming data. Once aligned with the incoming data, the output of VCO 
106
 is used as the clock signal for interpreting incoming data
A conventional PLL circuit 
300
 containing a phase detector 
330
 is depicted in 
FIG. 3. A
 description and operating theory behind circuit 
300
 can be found in “A Self Correcting Clock Recovery Circuit,” 
IEEE Journal of Lightwave Technology
, vol. LT-3, pp. 1312-1314, Dec. 1985. Circuit 
300
 provides a basic means for aligning data and clock phase and comprises phase detector 
330
, loop filter 
328
 and VCO 
314
.
Phase detector 
330
 comprises two D flip flops 
302
 and 
304
 connected in series, and two XOR gates 
306
 and 
308
 tied to the input and output of, respectively, flip-flops 
302
 and 
304
. Incoming data is supplied to input node 
310
 of flip-flop 
302
 and the input of XOR gate 
306
. VCO 
314
 provides a clock signal to flip-flop 
302
 at its clock input node 
316
. D flip-flop 
302
 enables its output 
312
 on every rising edge of this clock signal. Output 
312
 is connected directly to the input of XOR gates 
306
 and 
308
, as well as to the input to D flip-flop 
304
. D flip-flop 
304
 enables its output 
318
 on the rising edge of the inverted clock signal provided by VCO 
314
. Hence, flip-flops 
302
 and 
304
 operate one-half clock cycle apart. The output 
318
 of D flip-flop 
304
 is connected to the second input of XOR gate 
308
.
Phase detector 
330
 produces two phase detection signals by which the phase offset is measured. The phase detection signals, commonly referred to as reference signals, are square pulse signals generated for each transition of the incoming data and having a fixed width equal to half the clock period. The first phase detection signal is output 
324
 of XOR gate 
308
. It is a square pulse signal commonly referred to as a reference signal that is generated for every transition of the incoming data and has a fixed width equal to half the clock period.
The second phase detection signal is provided by the output 
322
 of XOR gate 
306
. The second phase detection signal is a variable width, square pulse signal with a pulse generated for every transition of the incoming data. The width of this square pulse is dependent upon the position of the rising clock edge in relation to each incoming data transition. This signal is commonly referred to as an error signal. When the rising edge of the clock is in phase with the incoming data, the width of the data pulses produced in the error and reference signals are the same. There is no difference in average value between the signals and correspondingly, the frequency of VCO 
314
 is not modulated.
When the rising edge of the clock lags behind the incoming data transition, the data pulse in the error signal decreases in width and has an average value less than the fixed width pulse of the reference signal. As a result, a negative error voltage is produced by loop filter 
328
 and fed to VCO 
314
. When the rising edge of the clock arrives before the incoming data transition, the data pulse in the error signal increases in width and has an average value more than the fixed width pulse of the reference signal. As a result, a positive error voltage is produced by loop filter 
328
 and fed to VCO 
314
.
As data frequencies rise, the delay, hold and setup times associated with circuit 
300
 become smaller in order to accommodate shorter data pulse widths and to guard against timing violations. However, phase detector 
300
 will begin to experience difficulty at these higher frequencies. Properly balancing propagation delays and drive strengths of the D flip-flops 
302
 and 
304
 becomes very difficult. In order for the flip-flops to be powerful enough to drive their outputs to satisfy shorter hold and setup times, they must be larger in terms of circuit geometry. But as their size increases, the distance the distance that data signal 
310
 must travel also increases and creates longer propagation delays. The propagation delays will begin to violate the hold and setup times of the various logic gates and the circuit will fail to recognize data pulses. These pulses are generally referred to as “missed pulses.” Missed pulses can translate into a “dead zone” in the analog voltage signal at the phase detector output, resulting in phase jitter. An analog voltage signal 
202
 with a dead zone 
204
 is demonstrated in FIG. 
2
B.
Phase jitter is a time variation in the clock edge produced by VCO 
106
, in which the edge moves back and forth instantaneously and oscillates around the targeted position. This is undesirable because it results in a dynamically varying amount of time available for logic computations. P
Conexant Systems Inc.
Nghiem Michael
SEED IP Law Group PLLC
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