Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2011-07-05
2011-07-05
Mehta, Bhavesh M (Department: 2624)
Image analysis
Applications
Manufacturing or product inspection
C382S141000, C348S246000, C348S247000
Reexamination Certificate
active
07974458
ABSTRACT:
A method for detecting defects in camera modules is provided. The method includes the following: an image is acquired from the camera module; a comparison formula and a standard value of defect luminance are set; the image is divided into many test regions; the corresponding reference regions are then plotted out; a test region is selected, and a reference region is confirmed correspondingly; averages of gray scale values of the selected test region and the confirmed reference region are calculated; a defect luminance of the selected test region is calculated; the calculated defect luminance is compared with the standard value for confirming whether the camera module is of satisfactory quality. A related system is also disclosed.
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Hon Hai Precision Industry Co. Ltd.
Knapp Jeffrey T.
Mehta Bhavesh M
Thirugnanam Gandhi
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