Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2006-05-30
2006-05-30
Tang, Minh N. (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S701000
Reexamination Certificate
active
07053645
ABSTRACT:
A system and method for detecting a defect in a transistor array includes applying a test signal to the array, monitoring pixel voltages along a gate line of the array, and detecting a defect associated with the gate line based on a variation in the pixel voltages along the gate line during the monitoring step. The system and method can also detect a precise location of the defect based on a rate of change in the variation of the pixel voltages along the gate line.
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Fleshner & Kim LLP
Tang Minh N.
YieldBoost Tech, Inc.
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