Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2004-02-24
2008-12-09
Desire, Gregory M (Department: 2624)
Image analysis
Applications
Manufacturing or product inspection
C382S144000, C382S218000
Reexamination Certificate
active
07463765
ABSTRACT:
An inspection process and an inspection system (600) that utilize a plurality of residual defect signals252(1),252(2), . . .252(n) to identify and report defects of interest in a copy (116) of a standard (112). The process includes performing a multi-variant defect extraction method (200) that includes applying a number n of pre-determined transforms to both a data file (232) containing the standard and an image file (204) containing the copy of the standard so as to create a plurality of conditioned data files (244(1),244(2), . . .244(n)) and a plurality of conditioned image files (216(1),216(2), . . .216(n)). The plurality of residual defect signals are extracted from these conditioned files. A defect analysis and reporting method (500) utilizes the residual defect signals to report defects contained in two or more of the residual defect signals.
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Messina Vincent J.
Ronning Donald J.
Desire Gregory M
Downs Rachlin & Martin PLLC
Lamda-Lite Enterprises Incorporated
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