System and method for detecting and analyzing pattern...

Details System and method for detecting and analyzing pattern... System and method for detecting and analyzing pattern...

2011-08-09

2011-08-09

Vu, Bai D. (Department: 2165)

Data processing: database and file management or data structures

Database and file access

Preparing data for information retrieval

Reexamination Certificate

active

07996404

ABSTRACT:
In its broad aspect, the invention provides a method for analyzing relationships among patterns within a data set having a set of samples and associated attribute values defining each attribute of each said sample. The method comprises receiving at an input at least two patterns; defining a data cluster within the data set for each of said at least two patterns, each defined data cluster having samples with attribute values associated with a corresponding pattern of said at least two patterns; grouping at least some of the samples of each defined data cluster with one another to generate a resultant data cluster; and calculating a variation between the attribute values of a first set of samples and the attribute values of a second set of samples within said resultant data cluster, the attribute values of the first set of samples and the second set of samples corresponding to the same attribute.

REFERENCES:
patent: 2004/0049504 (2004-03-01), Hellerstein et al.
patent: 2005/0027710 (2005-02-01), Ma et al.
Hwang et al.: “Uncertain Fuzzy Clustering: Interval Type-2 Fuzzy Approach to C-Means”, IEEE Transactions on Fuzzy systems, vol. 15, Issue 1, Feb. 2007, p. 107-120.

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