X-ray or gamma ray systems or devices – Electronic circuit – With display or signaling
Reexamination Certificate
2006-11-28
2006-11-28
Glick, Edward J. (Department: 2882)
X-ray or gamma ray systems or devices
Electronic circuit
With display or signaling
C378S098000
Reexamination Certificate
active
07142636
ABSTRACT:
A method and system for an improved data acquisition system with an image detector array and an image processing system which finds a malfunctioning cell, interpolates a signal for the malfunctioning cell using neighboring channels of the cell, and corrects the interpolation with an error rate found in performing interpolations on neighboring rows with cells which are not malfunctioning. The image processing system may include a DAS and a reconstruction system. The step of finding a malfunctioning cell may be accomplished through a variety of methods, such as measuring discrepancies between a cell's and its neighboring cell's average readings over time and exposing the cells to x-rays which should produce similar readings in all the cells and comparing the cells' signals, looking for discrepancies. The step of interpolating and the step of correcting may take into consideration cells within the same projection view as the malfunctioning cell.
REFERENCES:
patent: 6118846 (2000-09-01), Liu
patent: 6385292 (2002-05-01), Dunham et al.
patent: 2003/0001078 (2003-01-01), Baharav et al.
patent: 2005/0030394 (2005-02-01), Mendis et al.
patent: 11027523 (1999-01-01), None
patent: 411027523 (1999-01-01), None
T.G. Riess, Q. Spreiter, T.O. Fuchs, T. Von der Haar, and W.A. Kalendar, “A fast and efficient method for the correction of defective channels in x-ray CT area detectors,” Radiology 225(p), pp. 404, 2002.
Hsieh Jiang
Williams Eugene Clifford
Dellapenna Michael A.
General Electric Company
Glick Edward J.
Kiknadze Irakli
McAndrews Held & Malloy Ltd.
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