System and method for decreasing ESD damage during component...

Details System and method for decreasing ESD damage during component... System and method for decreasing ESD damage during component...

2006-02-28

2006-02-28

Nguyen, Vinh (Department: 2829)

Electricity: measuring and testing

A material property using electrostatic phenomenon

C324S457000, C324S1540PB, C361S056000, C361S058000

Reexamination Certificate

active

07005858

ABSTRACT:
A method is disclosed for minimizing damage from electrostatic discharge (ESD) during long-term testing of electronic components and assemblies. The method includes conducting a stress-test, during which a protection circuit is engaged, which shields components and assemblies from ESD. Then at least one functional test is conducted, at which time, the protection circuit is disengaged.Also disclosed is a system for conducting long-term testing of electronic components and assemblies while providing protection from ESD. The system includes a testing circuit for providing current to the components and assemblies during the long-term testing which includes at least one stress-testing phase and at least one functional testing phase. Also included is a protection circuit for protecting the components and assemblies during said stress-testing phase of said long-term testing. A switch is included for disengaging the protection circuit from the components and assemblies during said functional testing phase of said long-term testing.

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