System and method for deconvoluting the effect of topography...

Data processing: artificial intelligence – Neural network – Learning task

Reexamination Certificate

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C706S015000, C706S026000

Reexamination Certificate

active

07366704

ABSTRACT:
A method for using a neural network to deconvolute the effects due to surface topography from the effects due to the other physical property being measured in a scanning probe microscopy (SPM) or atomic force microscopy (AFM) image. In the case of a thermal SPM, the SPM probe is scanned across the surface of a sample having known uniform thermal properties, measuring both the surface topography and thermal properties of the sample. The data thus collected forms a training data set. Several training data sets can be collected, preferably on samples having different surface topographies. A neural network is applied to the training data sets, such that the neural network learns how to deconvolute the effects dues to surface topography from the effects dues to the variations in thermal properties of a sample.

REFERENCES:
patent: 6095679 (2000-08-01), Hammiche et al.
patent: 6260997 (2001-07-01), Claybourn et al.
patent: 6405137 (2002-06-01), Reading
patent: 6491425 (2002-12-01), Hammiche et al.
patent: 6666075 (2003-12-01), Mancevski et al.
patent: 6690016 (2004-02-01), Watkins et al.
patent: 2001/0001755 (2001-05-01), Sandhu et al.
patent: 2001/0027018 (2001-10-01), Molnar
patent: 2002/0048531 (2002-04-01), Fonash et al.
patent: 2002/0121131 (2002-09-01), Mancevski et al.
patent: 2005/0074871 (2005-04-01), Albert et al.
patent: WO9940417 (1999-12-01), None
patent: WO-99/40417 (1999-12-01), None
D. Price et al. “New Adventures in Thermal Analysis” Journal of Thermal Analysis and Calorimetry, vol. 60 (2000).
D. Grandy et al. “Microthermal Characterization of Segmented Polyurethane Elastomers and a Polystyrene-Poly(methyl methacryalate) Polymer Blend Using Variable Temperature Pulsed Force Mode Atomic Force Microscopy” Macromolecules 2000 (33, 9348-9359).
H.M. Pollock and A. Hammiche, “Micro-thermal analysis: techniques and applications,” J. Physics D: Applied Physics, 2001, vol. 34, pp. R23-R53.

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