Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Distributive type parameters
Reexamination Certificate
2008-03-06
2010-06-22
Nguyen, Hoai-An D (Department: 2831)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Distributive type parameters
C324S601000, C702S085000
Reexamination Certificate
active
07741857
ABSTRACT:
S-parameter data is measured on an embedded device test structure, an open dummy, and a short dummy. A 4-port network of the pad set parasitics of the embedded device test structure is modeled by a parameterized netlist containing a lumped element network having at least one parameterized lumped element. The S-parameter data across a range of measurement frequencies is fitted with the parameterized netlist employing the at least one parameterized lumped element as at least one fitting parameter for the S-parameter data. Thus, the fitting method is a multi-frequency fitting for the at least one parameterized lumped element. A 4-port Y-parameter (admittance parameter) is obtained from the fitted parameterized netlist. The Y-parameter of the device under test is obtained from the measured admittance of the embedded device test structure and the calculated 4-port Y parameter.
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Q. Liang, et al., “A Simple Four-Port Parasitic Deembedding Methodology for High-Frequency Scattering Parameter and Noise Characterization of SiGe HBTS,” IEEE Transactions on Microwave Theory and Techniques, vol. 51, No. 11, pp. 2165-2174.
Jagannathan Basanth
Jin Zhenrong
Li Hongmei
Canale Anthony J.
International Business Machines - Corporation
Nguyen Hoai-An D
Scully , Scott, Murphy & Presser, P.C.
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