Data processing: measuring – calibrating – or testing – Measurement system – Statistical measurement
Reexamination Certificate
2005-04-19
2005-04-19
Wachsman, Hal (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system
Statistical measurement
C702S097000
Reexamination Certificate
active
06882958
ABSTRACT:
A system and method for performing a curve fit on a plurality of data points. In an initial phase, a subset Pmaxof the plurality of points which represents an optimal curve is determined. This phase is based on a statistical model which dictates that after trying at most Nminrandom curves, each connecting a randomly selected two or more points from the input set, one of the curves will pass within a specified radius of the subset Pmaxof the input points. The subset Pmaxmay then be used in the second phase of the method, where a refined curve fit is made by iteratively culling outliers from the subset Pmaxwith respect to a succession of optimal curves fit to the modified subset Pmaxat each iteration. The refined curve fit generates a refined curve, which may be output along with a final culled subset Kfinalof Pmax.
REFERENCES:
patent: 5617491 (1997-04-01), Roth
patent: 5940083 (1999-08-01), Broekhuijsen
patent: 5987172 (1999-11-01), Michael
patent: 6154567 (2000-11-01), McGarry
patent: 6408109 (2002-06-01), Silver et al.
patent: 6535213 (2003-03-01), Ogino et al.
U.S. Appl. No. 09/894,272 filed, Jun. 28, 2001.
“Numerical Recipes in Fortran 77: The Art of Scientific Computing” (ISBN 0-521-43064-X) pp. 299-306, Copyright 1986-1992, no month!.
Nair Dinesh
Rajagopal Ram
Schmidt Darren
Wenzel Lothar
Hood Jeffrey C.
National Instruments Corporation
Wachsman Hal
Williams Mark S.
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