System and method for correlating photoreceptor pigmented...

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer

Reexamination Certificate

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Reexamination Certificate

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08045156

ABSTRACT:
The presently disclosed embodiments are directed to a system and method for obtaining spectra of highly scattering pigmented layers and providing a spectral reflection ratio, which can be correlated to photoreceptor electrical performance. The present embodiments employ the use of dark field microscopy in combination with a noise reducing normalization technique to provide real-time production adjustments to optimize photoreceptor characteristics and/or performance.

REFERENCES:
patent: 5784162 (1998-07-01), Cabib et al.
patent: 6368758 (2002-04-01), Camp et al.
patent: 2008/0097173 (2008-04-01), Soyemi et al.

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