Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Reexamination Certificate
2009-06-23
2011-10-25
Chowdhury, Tarifur (Department: 2886)
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
Reexamination Certificate
active
08045156
ABSTRACT:
The presently disclosed embodiments are directed to a system and method for obtaining spectra of highly scattering pigmented layers and providing a spectral reflection ratio, which can be correlated to photoreceptor electrical performance. The present embodiments employ the use of dark field microscopy in combination with a noise reducing normalization technique to provide real-time production adjustments to optimize photoreceptor characteristics and/or performance.
REFERENCES:
patent: 5784162 (1998-07-01), Cabib et al.
patent: 6368758 (2002-04-01), Camp et al.
patent: 2008/0097173 (2008-04-01), Soyemi et al.
Griffin Scott J.
Herko Jonathan H.
Pietrantoni Dante M.
Roetker Michael S.
Zaman Kamran U.
Chowdhury Tarifur
Nur Abdullahi
Pillsbury Winthrop Shaw & Pittman LLP
Xerox Corporation
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