Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent
1996-06-21
1997-09-23
Nelms, David C.
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
356345, 385 78, G01B 902
Patent
active
056710496
ABSTRACT:
A return loss determination system contactlessly and automatically determines a product-to-product return loss of an optical fiber connector having a domed optical fiber termination endface (i.e., an endface having an optical fiber and a surrounding support ferrule). The return loss determination system includes (a) an undercut/protrusion (U/P) inspection system for determining a U/P parameter corresponding with an offset of the fiber relative to a curvature of the ferrule along an axis of the fiber, (b) a dome polish eccentricity (DPE) inspection system for determining a DPE parameter corresponding with a displacement in a plane perpendicular to the axis between a curvature center of the curvature and a fiber center of the fiber, (c) a curvature radius (CR) inspection system for determining a CR parameter corresponding with a radius of the curvature relative to the curvature center, (d) a discontinuity inspection system for determining a discontinuity parameter to quantify surface discontinuities in the fiber, and (e) a return loss evaluation system for determining a return loss of the connector based upon the parameters.
REFERENCES:
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patent: 4738508 (1988-04-01), Palmquist
patent: 4787698 (1988-11-01), Lyons et al.
"Checkmate F5 System Instruction Manual," Oyokoden Lab Co., Ltd. (at least as early as 1991).
"Norland Fiber Interferometer," Norland Products Inc., New Brunswick, NJ (1992).
"ZX-1 Zoom Interferometers," Direct Optical Research Company, Phoenix, AZ (at least as early as Jan. 1995).
"TOPO-3D Quick Tour Manual," Wyko Corporation, Tucson, AZ., Ltd. (Feb. 1990).
Norland, Eric A., "Defining and Measuring Physical Parameters of PC Polished Connectors," The 10th Annual National Fiber Optic Engineers Conference, San Diego, CA, Jun. 12-16, 1994, pp. 259-265.
Harding, Kevin et al., "Light Engineering for Machine Vision: Techniques and Applications," Part 1 and Part 2, Mar. 2-3, 1994, Ann Arbor, Michigan, Manufacturing Engineering Certification Institute sponsored by SME.
Csipkes Andrei
Palmquist John Mark
Kim Robert
Lucent Technologies - Inc.
Nelms David C.
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