Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Mechanical measurement system
Patent
1997-01-10
1999-10-12
Peeso, Thomas
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Mechanical measurement system
364507, 356 30, B44B 500
Patent
active
059666730
ABSTRACT:
A system and method for computerized grading of the cut of a gemstone. The system includes a gemstone model and an illumination model. The gemstone model defines the cut of the gemstone in three dimensions with reference to the facets of the gemstone. The illumination model defines light projected onto the gemstone. The method includes the steps of determining a beam of light refracted into the gemstone from the illumination model for at least one of the facets, tracing reflections of the beam of light within the gemstone, and measuring at least one light beam refracted out of the gemstone model. The measurements of the refracted light are used to evaluate the gemstone.
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Diamond Technologies, Inc.
Peeso Thomas
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