Data processing: measuring – calibrating – or testing – Calibration or correction system – Timing
Reexamination Certificate
2006-12-21
2008-11-18
Ramos-Feliciano, Eliseo (Department: 2857)
Data processing: measuring, calibrating, or testing
Calibration or correction system
Timing
C702S090000, C702S182000, C702S183000
Reexamination Certificate
active
07454303
ABSTRACT:
The present invention is directed to a method for compensating for process, voltage, and temperature variation without complex online/offline swapping of data paths requiring a dedicated FIFO(First-in First-out) buffer design. Delay cells are trained for each clock path (namely a Functional delay) and a spare delay cell is trained. A ratio is calculated for each Functional delay cell by dividing the Functional delay cells' setting into the spare delay cells' one-fourth cycle setting. These ratios reflect any process variation. Functional mode is then entered and a Master-Slave approach switched to, during which the spare delay cell repeats the training sequence continuously while the Functional delay cells delay the clocks from the RAM(Random Access Memory). Each Functional delay cell is updated at the end of each training sequence of the spare delay cell, compensating for voltage and temperature change, by dividing the ratio into the new spare delay cell one-fourth cycle setting.
REFERENCES:
patent: 5949778 (1999-09-01), Abu-Amara et al.
patent: 5953318 (1999-09-01), Nattkemper et al.
patent: 6084865 (2000-07-01), Dent
patent: 6108394 (2000-08-01), Dilbeck
patent: 2005/0155001 (2005-07-01), Kinoshita et al.
Hughes Thomas
Kong Cheng-Gang
Magee Terence
LSI Logic Corporation
Ramos-Feliciano Eliseo
Suarez Felix
Suiter Swantz PC LLO
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