System and method for characterizing a potential distribution

Details System and method for characterizing a potential distribution System and method for characterizing a potential distribution

2006-12-19

2009-12-22

Chang, Joseph (Department: 2817)

Oscillators

With particular source of power or bias voltage

C331S057000, C331S186000

Reexamination Certificate

active

07636023

ABSTRACT:
An apparatus for characterizing an operating parameter in an integrated circuit, in accordance with one embodiment of the present invention, includes a voltage potential module, a plurality of distribution systems and a plurality of ring oscillator modules. Each ring oscillator module is coupled to the voltage potential module by a respective distribution system. Each ring oscillator module generates an oscillator signal as a function of the voltage potential and a voltage drop caused by the respective distribution system. The characterization of the operating parameter may be extrapolated from the difference in the operating frequencies of the ring oscillator modules.

REFERENCES:
patent: 6104254 (2000-08-01), Iravani
patent: 6927619 (2005-08-01), Doyle
patent: 2002/0140456 (2002-10-01), Mizuno et al.

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