System and method for calibrating weak write test mode (WWTM)

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system

Reexamination Certificate

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Details

C702S107000, C702S117000, C365S201000

Reexamination Certificate

active

07076376

ABSTRACT:
According to at least one embodiment, a method comprises measuring drive current of a reference memory cell of a circuit, and determining, based on the measured drive current of the reference memory cell, a drive current to be supplied to a calibration memory cell of the circuit to mimic a defective memory cell. The method further comprises supplying the determined drive current to the calibration memory cell, and using the calibration memory cell to determine strength of a weak write to be utilized by a weak write test for detecting defective memory cells.

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