Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2006-07-11
2006-07-11
Wachsman, Hal (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S107000, C702S117000, C365S201000
Reexamination Certificate
active
07076376
ABSTRACT:
According to at least one embodiment, a method comprises measuring drive current of a reference memory cell of a circuit, and determining, based on the measured drive current of the reference memory cell, a drive current to be supplied to a calibration memory cell of the circuit to mimic a defective memory cell. The method further comprises supplying the determined drive current to the calibration memory cell, and using the calibration memory cell to determine strength of a weak write to be utilized by a weak write test for detecting defective memory cells.
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Weiss Donald R
Woodruff Richard L.
Wuu John J.
Hewlett--Packard Development Company, L.P.
Wachsman Hal
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