Data processing: measuring – calibrating – or testing – Calibration or correction system – Signal frequency or phase correction
Reexamination Certificate
2007-07-10
2007-07-10
McElheny, Jr., Donald E. (Department: 2863)
Data processing: measuring, calibrating, or testing
Calibration or correction system
Signal frequency or phase correction
C331S044000
Reexamination Certificate
active
10544608
ABSTRACT:
In order to further develop a system (100) and a method for calibrating the clock frequency of at least one clock generator unit (38), in particular oscillator unit, that is assigned to at least one transmitting/receiving module (30), wherein—the transmitting/receiving module (30) communicates with at least one microcontroller unit (10) over at least one data line (20) and—the clock generator unit (38) is assigned at least one calibration unit (36), in such a manner that with significantly reduced system costs the clock frequency of the clock generator unit (38) can be calibrated with very high accuracy, it is proposed that—in order to calibrate the clock frequency of the clock generator unit (38) at least one calibration unit (36) is assigned to the clock generator unit38), —the calibration unit (36) can be set in binary terms by means of at least one command signal (COM) via the data line (20), —the clock generator unit (38) is assigned at least one binary counter (34) that is clocked by the clock generator unit (38), in particular by the output frequency (fout) of the clock generator unit (38) and—within the transmitting/receiving module (30) there is at least one control logic mechanism (32) which is connected (STA, OFL or SET) to the calibration unit (36) or to the binary counter (34), which control logic mechanism, following reception of the command signal (COM), resets the binary counter (34), starts it (STA) and awaits the expiry or overflow (OFL) of the binary counter (34).
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Le Toan M.
McElheny Jr. Donald E.
NXP B.V.
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