Measuring and testing – Instrument proving or calibrating – Timing apparatus
Reexamination Certificate
2007-02-06
2009-08-25
Raevis, Robert R (Department: 2856)
Measuring and testing
Instrument proving or calibrating
Timing apparatus
Reexamination Certificate
active
07578163
ABSTRACT:
A timing calibration system for an adjustable delay time of a delay module for an electronic circuit is provided. The system includes a control delay module including at least one calibration delay module, the control delay module having a second delay time. The system also includes a timing module associated with the control delay module, a comparison module associated with the timing module and an adjustment module for the delay module. The timing module measures the second delay time, the comparison module compares the second delay time with a desired delay time and produces a comparison result and the adjustment module calibrates the adjustable delay time utilizing the comparison result.
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“DDR SDRAM Functionality and Controller Read Data Capture”, Design Line, pp. 1-24, vol. 8, Issue 3, 3Q99, Micron Technology, Inc., Boise, Idaho, U.S.A.
“DDR SDRAM Functionality and Controller Read Data Capture”, Design Line, pp. 1-24, vol. 8, Issue 3, 3Q99, Micron Technology, Inc., Boise, Idaho, U.S.A. 1999.
Greidanus Henry Steven
Labib Rami Emad
Alcatel-Lucent Canada Inc
Raevis Robert R
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