System and method for automatically discovering total...

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C324S600000, C713S300000

Reexamination Certificate

active

07944221

ABSTRACT:
A system and method for automatically discovering total transistor resistance in a hybrid power over Ethernet (PoE) architecture. A critical factor for a PoE system is the total resistance of the power FET. Typical PoE systems consist of a single power FET that may be integrated with the controller or external to the controller. In a hybrid architecture the PoE system consists of both an internal power FET and an external power FET. The external power FET can be used to customize a design to meet a particular application or need. The total resistance in the hybrid architecture can be automatically determined using voltage and current measurements of the internal and external power FETs.

REFERENCES:
patent: 6906536 (2005-06-01), Pearce et al.
patent: 7157959 (2007-01-01), Ball et al.
BCM59103, Product Brief, Broadcom Corporation, Apr. 20, 2007.
BCM59101 Product Brief, Broadcom Corporation.
BCM59103 Product Brief, Broadcom Corporation.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

System and method for automatically discovering total... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with System and method for automatically discovering total..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System and method for automatically discovering total... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2669151

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.