Data processing: measuring – calibrating – or testing – Calibration or correction system – Temperature
Reexamination Certificate
2005-07-18
2010-10-05
Lau, Tung S (Department: 2863)
Data processing: measuring, calibrating, or testing
Calibration or correction system
Temperature
Reexamination Certificate
active
07809519
ABSTRACT:
There is provided a system and method for automatically calibrating a temperature sensor. More specifically, there is provided a system made up of a temperature sensor which includes a first resistance configured to indicate a temperature of the temperature sensor and a second resistance, in series with the first resistor, wherein the second resistance is adjustable to calibrate the first resistance, and a calibration circuit, coupled to the temperature sensor and configured to automatically calibrate the first resistance.
REFERENCES:
patent: 3857285 (1974-12-01), Athey et al.
patent: 3932849 (1976-01-01), Welch
patent: 4523084 (1985-06-01), Tamura et al.
patent: 6377110 (2002-04-01), Cooper
patent: 6678185 (2004-01-01), Cleary
patent: 7368973 (2008-05-01), Sato
patent: 2006/0044047 (2006-03-01), Porter
patent: 08304313 (1996-11-01), None
Ayyapureddi Sujeet
Roth Brandon
Sinha Manoj
Fletcher Yoder
Lau Tung S
Micro)n Technology, Inc.
Sun Xiuquin
LandOfFree
System and method for automatically calibrating a... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with System and method for automatically calibrating a..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System and method for automatically calibrating a... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4163990