Data processing: structural design – modeling – simulation – and em – Simulating electronic device or electrical system
Reexamination Certificate
2007-12-04
2007-12-04
Ferris, Fred (Department: 2128)
Data processing: structural design, modeling, simulation, and em
Simulating electronic device or electrical system
C703S014000, C703S015000, C716S030000, C716S030000
Reexamination Certificate
active
10758070
ABSTRACT:
A system and method for testing a development device includes extracting multiple parameters of the development device from a product specification for the development device. The parameters being arranged in a predetermined first order. The parameters are stored in a testing data file. The testing data file can be input into a test bench system being coupled to the development device. The test bench system can test the development device.
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Kong Fanyun (Michelle)
Lee Douglas
Packer John
Spitzer Marc
Adaptec, Inc.
Ferris Fred
Martine & Penilla & Gencarella LLP
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