Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation
Reexamination Certificate
2006-04-04
2006-04-04
Hoff, Marc S. (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system
Performance or efficiency evaluation
C716S030000
Reexamination Certificate
active
07024337
ABSTRACT:
A system and method for analyzing noise includes an error information storage unit storing threshold values of malfunction factors that create a malfunction of a victim receiver cell due to a noise, an error criterion generation section which selects the threshold values from the error information storage unit, and generates an error criterion according to the victim receiver cell by plotting the threshold values and conducting the threshold values smooth processing on, a noise analysis section configured to measure the malfunction factors, and a comparison section configured to compare the measured malfunction factors to the error criterion, and to judge whether the noise will create a malfunction of the victim receiver cell when the malfunction factors meet the error criterion.
REFERENCES:
patent: 5481695 (1996-01-01), Purks
patent: 6378109 (2002-04-01), Young et al.
patent: 6499131 (2002-12-01), Savithri et al.
patent: 6591402 (2003-07-01), Chandra et al.
patent: 6665845 (2003-12-01), Aingaran et al.
patent: 2003/0079191 (2003-04-01), Savithri et al.
patent: 5-342305 (1993-12-01), None
Charioui Mohamed
Hoff Marc S.
Kabushiki Kaisha Toshiba
LandOfFree
System and method for analyzing noise does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with System and method for analyzing noise, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System and method for analyzing noise will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3588337