System and method for analyzing modeling accuracy while...

Computer graphics processing and selective visual display system – Computer graphics processing

Reexamination Certificate

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Details

C345S419000, C345S423000, C382S128000, C356S601000, C033S554000

Reexamination Certificate

active

07821513

ABSTRACT:
An automated mechanism for measuring the amount of accuracy loss attributable to reverse engineering processes that use 3D scan data is discussed. The embodiments provide a mechanism that displays to a user the effect scan data editing and CAD remodeling operations have on scan data accuracy. Additionally, the user can choose the way the graphical display illustrates the error distribution on the model such as by color mapping and whisker mapping. The accuracy loss may be displayed to the user after finishing an editing/modeling command or during the previewing of the command thereby allowing a user to take appropriate action. Parameters may also be adjusted programmatically based on the amount of accuracy loss determined to be attributable to scan data editing or CAD remodeling operations.

REFERENCES:
patent: 6032377 (2000-03-01), Ichikawa et al.
patent: 6532299 (2003-03-01), Sachdeva et al.
patent: 6542249 (2003-04-01), Kofman et al.
patent: 6545676 (2003-04-01), Ryan et al.
patent: 7068825 (2006-06-01), Rubbert et al.
patent: 2005/0134586 (2005-06-01), Koo et al.
“The Error Analysis of Product Reverse Engineering,”Machinery Design&Manufacture, vol. 6:66-68 (2000).
Liyan, Zhang et al., “Error Analysis and Visualization of Reconstructed Triangle Mesh Survace,”Journal of Nanjing University of Aeronautics&Astronautics, vol. 33(3):282-285 (2001).
Wei, Zhang et al., “The Error Analysis and Quality Control of Reverse Engineering,”Mechanical&Electrical Engineering Magazine, vol. 18(1):14-16 (2001).
Jang, Soo-Pyeong, “Three-dimension Reconstruction of Complicated Surface Based on Point Cloud Data,” Master's Thesis abstract published by Xin Jiang University (2004).

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