Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2005-08-26
2009-12-15
Nghiem, Michael P. (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C375S226000
Reexamination Certificate
active
07634371
ABSTRACT:
The present invention provides a system and a method for analyzing jitter of various signals including measurement signals and simulation signals. The method includes the steps of: (a) obtaining a signal file; (b) identifying a type of the signal file; (c) defining a jitter analysis mode from a phase jitter mode, a periodic jitter mode and a cycle jitter mode; (d) obtaining an n-bit differential signal from the signal file; (e) rebuilding an ideal clock based on the differential signal by means of performing a Minimum Deviation Algorithm (MDA); (f) calculating and analyzing jitter of the differential signal according to the ideal clock by means of performing the MDA; and (g) generating and outputting a jitter analysis wave and jitter analysis results according to the defined jitter analysis mode.
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Stephens, R., Analyzing Jitter At High Data Rates, Feb. 2004, IEEE Optical Communications, pp. S6-S10.
Hsu Shou-Kuo
Li Cheng-Shien
Chew Raymond J.
Hon Hai Precision Industry Co. Ltd.
Le Toan M
Nghiem Michael P.
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